Rad hard MOSFETs
Rad hard MOSFETs subcategories
Infineon is a leader in high-reliability power solutions, with its subsidiary, IR HiRel, being the first manufacturer to offer rad hard power MOSFETs for space in 1987. Over the last three decades, IR HiRel has continuously innovated in silicon design, packaging technology and quality with US DLA QPL products up to MIL-PRF-19500 JANS level.
Infineon offers a broad selection of n-channel and p-channel rad hard MOSFETs in a wide range of hermetic packaging screened to MIL-PRF-19500 and ESCC-5000, and available as QPLs. Select rad hard MOSFETs are also available as bare die.
Our rad hard power solutions are used throughout spacecraft electrical power systems, and proven across thousands of programs globally that are still in flight today. Whether you’re designing satellite bus platforms, payloads or other spacecraft systems, we offer a broad selection of rad hard solutions qualified to ESA and DLA standards for our global customers
Customers benefit from Infineon’s expertise in power MOSFET radiation testing, and a suite of products and solutions engineered for high performance and longevity in extreme environmental conditions.
Unlike standard commercial products, HiRel products must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often harsh environments of military and space applications. Both the United States and European community have each developed specifications that detail the sequence of quality conformance testing.
- In Europe, the European Space Agency (ESA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on discrete semiconductor components, hermetically sealed and die, namely ESCC-5000.
- In the United States, the Defense Logistics Agency (DLA)is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules, namely MIL-PRF-19500/MIL-STD-750, MIL-PRF-38534/MIL-STD-883 and MIL-PRF-38535/MIL-STD-883.
MIL-PRF-19500/MIL-STD-750 are the controlling specifications for discrete semiconductors such as diodes and power MOSFETs. MIL-PRF-19500 directs discrete semiconductors to be manufactured to either JAN, JANTX, JANTXV, or JANS levels (Note: the JAN level is not allowed for MOSFETs).
Infineon HiRel hermetic products are available as (1) commercial hermetic, designated (P) with the same fit, form and function as the flight parts and without radiation hardness or screening per Chart F3 in ESCC Generic Specification No. 5000, or (2) ESCC-5000 space-qualified for flight use. Such parts are denoted as (ES). Infineon-branded rad hard MOSFETs are also available as qualified bare die.
International Rectifier HiRel Products Group manufactures and tests hermetic products to one of three distinct quality conformance levels: (1) commercial hermetic, (2) source control drawing (SCD), or (3) MIL-PRF-38534, MIL-PRF-38535 qualified. Select products are also available as bare die.
Screening and Quality Conformance Inspection Requirements
Class H: Class H is the standard military quality level provided in MIL-PRF-38534, General Specification for Hybrid Microcircuits. It is intended for space applications.
Level B: Class level B defines the screening requirements for high reliability military applications as specified in MIL-STD-883 and is intended for use in class H products.
Level S: Class level S defines the screening requirements for high reliability space applications as specified in MIL-STD-883 and is intended for use in class K products.
JAN: JAN (Joint Army Navy) is the prefix assigned by the DLA to designate devices on the DLA qualified parts list.
JANTX: Military screening level as specified in MIL-PRF-19500 for a DLA qualified device.
JANTXV: Military with visual inspection screening level as specified in MIL-PRF-19500 for a DLA qualified device.
JANS: Space level screening as specified in MIL-PRF-19500 for a DLA qualified device.
